Proximity sensor

ABSTRACT

A method of manufacturing a sensor device includes obtaining a semiconductor die structure comprising a transmitter and a receiver. Then, a first sacrificial stud is affixed to the transmitter and a second sacrificial stud is affixed to the receiver. The semiconductor die is affixed to a lead frame, and pads on the semiconductor die structure are wirebonded to the lead frame. The lead frame, the semiconductor die structure, and the wirebonds are encapsulated in a molding compound, while the tops of the first and second sacrificial studs are left exposed. The first and second sacrificial studs prevent the molding compound from encapsulating the transmitter and the receiver, and are removed to expose the transmitter in a first cavity and the receiver in a second cavity. In some examples, the semiconductor die structure includes a first semiconductor die comprising the transmitter and a second semiconductor die comprising the receiver.

BACKGROUND

Many proximity sensors include a transmitter and a receiver. Thetransmitter transmits a signal, for example an optical signal or a radarsignal, and the receiver receives reflections of the transmitted signal.The time between signal transmission and receipt of the reflected signalcan be used to determine the distance between the proximity sensor andthe object off of which the transmitted signal was reflected, Channelisolation between the transmitter and receiver is important to achievingprecise measurements. Some sensing systems also require complexcalibration calibrations to determine the precise location of thetransmitter and receiver relative to each other. Also, optical sensingsystems require careful alignment of optical components, which canincrease the size of the sensing system. Some sensing systems attempt toplace the transmitter and receiver in a single package to ensure a fixedspatial relationship. However, building a transmitter and a receiverinto a single sensor package is complex, and the resulting sensorpackage is often not as small as desired for a particularimplementation.

SUMMARY

A method of manufacturing a sensor device includes obtaining asemiconductor die structure comprising a transmitter and a receiver.Then, a first sacrificial stud is affixed to the transmitter, and asecond sacrificial stud is affixed to the receiver. The semiconductorstructure is affixed to a lead frame, and pads on the semiconductorstructure are wirebonded to the lead frame. The lead frame, thesemiconductor structure, and the wirebonds are encapsulated in a moldingcompound, while the tops of the first and second sacrificial studs areleft exposed. The first and second sacrificial studs prevent the moldingcompound from encapsulating the transmitter and the receiver, and areremoved to expose the transmitter in a first cavity and the receiver ina second cavity.

In some examples, the semiconductor structure comprises a singlesemiconductor die with both the transmitter and the receiver. In someexamples, the semiconductor structure comprises two semiconductor die, afirst semiconductor die comprising the transmitter and a secondsemiconductor die comprising the receiver. In some implementations, thefirst and second cavities are filled with a non-molding compoundmaterial, such as a clear plastic, lenses, and the like. For example,the transmitter comprises a light source, and the receiver comprises alight detector. The first and second cavities are filled with atransparent compound to allow light to pass through from the lightsource and to the light detector. The molding compound forms a barrierbetween the first and second cavities in some examples.

In some implementations, the first and second sacrificial studs aretapered. In some examples, the first and second sacrificial studscomprise tubes such that the transmitter and the receiver remain exposedin the first and second cavities while the lead frame, the semiconductordie structure, and the wire bonds are encapsulated in the moldingcompound. In some examples, the first and second sacrificial studs coverthe transmitter and receiver, respectively, such that no part of thetransmitter and the receiver is exposed.

In some examples, the first and second sacrificial studs comprise metal,and removing the first and second sacrificial studs comprises etchingthe metal with an etching chemical chosen to etch the metal withoutdamaging the transmitter, the receiver, and the molding compound. Insome examples, the first and second sacrificial studs comprise a plasticor photoresist, and removing the first and second sacrificial studscomprises etching the plastic or photoresist without damaging thetransmitter, the receiver, and the molding compound. In some examples,the first and second sacrificial studs are glued to the transmitter andthe receiver with an adhesive, and are removed using a solvent to removethe adhesive from the transmitter and the receiver. The solvent ischosen to remove the adhesive without damaging the transmitter, thereceiver, and the molding compound.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an example light detection and ranging (LIDAR)system.

FIG. 2 illustrates an example overview of a sensor package moldingprocess.

FIGS. 3A-H illustrate an example fabrication process for a sensorpackage molding.

FIG. 4 illustrates an example sensor package molding with a multi-chipmodule.

FIG. 5 illustrates example shapes of sacrificial studs used infabricating a sensor package molding.

DETAILED DESCRIPTION

The sensor package manufacturing processes described herein includeplacing sacrificial studs to prevent flow of the molding compound overthe transmitter and receiver and to create a local cavity for thetransmitter and receiver channels. The sacrificial studs enablemassively parallel creation of cavities, as an entire lead frame with avery large number of semiconductor dies can be processed at once. Themolding compound forms a barrier between the transmitter and receiverchannels, improving channel isolation. The sacrificial studs are thenremoved to expose the transmitter and the receiver. Thus, the resultingsensor package can be made with standard equipment and manufacturingreliability. Also, a wide variety of sizes and shapes of the cavitiesfor the transmitter and receiver channels can be made with only minoradjustment to the manufacturing process.

FIG. 1 illustrates an example light detection and ranging (LIDAR) system100, which includes a light source 110, a sensor 120, and an integratedcircuit (IC) 130 including a detector. The light source 110 emits lightrays 140 that reflect off an object 180 and are collected by sensor 120.The distance between the LIDAR system 100 and the object 180 can bedetermined based on the data provided to IC detector 130 from sensor120. Without a barrier between sensor 120 and light source 110, lightrays 150 travel directly from light source 110 to sensor 120 andintroduce crosstalk into the sensor data, introducing error into thedistance determination. To reduce crosstalk and isolate the lighttransmitter and light receiver channels, a barrier is often placedbetween the light source 110 and sensor 120.

However to accurately determine distances, the light source 110 and thesensor 120 must be precisely located relative to each other and remainfixed, so the LIDAR system 100 does not need to perform extensivecalibration more than once. To combine the light source 110 and sensor120 into a single package, two hollow chambers are molded. Asemiconductor die with the light source 110 is placed into one chamber,and a semiconductor die with the sensor 120 is placed into the otherchamber. Both are wire bonded to the substrates within the chambers.Then the hollow chambers are filled with a transparent mold compound,which covers both semiconductor dies and protects the wire bonding whilestill allowing light to be emitted and received by the light source 110and the sensor 120.

The combination of two different mold compounds and substrates withdifferent properties causes manufacture of the two hollow chambers in asingle package to be unreliable. To improve the manufacturability, thedies are placed farther apart, and the overall package size increases.While a LIDAR system 100 with a light source 110 and a sensor 120 isdescribed in FIG. 1, any system with a transmitter channel and areceiver channel, such as radar systems and ultrasonic sensing systems,balances similar challenges with channel isolation, calibration, andmanufacturing.

FIG. 2 illustrates an example overview of a sensor package moldingprocess 200. Rather than separating the transmitter and the receiveronto different semiconductor dies, they are placed together on the samesemiconductor die structure 210 in the desired configuration andproximity to each other. Sacrificial studs are placed over thetransmitter and receiver to protect them during the next step of themolding process 200 and to create clear transmitter and receiverchannels. The semiconductor die structure 210 is then encapsulated in asingle standard molding compound but the sacrificial studs are leftexposed, as shown in semiconductor 220. The sacrificial studs can beremoved to expose the transmitter and receiver while maintaining abarrier of the molding compound between the two and ensuring channelisolation, resulting in the semiconductor die 230.

FIGS. 3A-H illustrate an example fabrication process for a sensorpackage molding. FIG. 3A illustrates an example semiconductor die 300including a transmitter 305 and a receiver 310 affixed on a die 320. Thetransmitter 305 and receiver 310 are arranged on a die 320 in a desiredconfiguration based on the intended implementation for the sensorpackage. The desired configuration can be chosen to simplify calibrationprocedures, increase the number of channels in an area on the die 320,or the like. FIG. 3B illustrates an example wafer 330 with multiple dies320 fabricated together. Next, sacrificial studs 335 and 340 are placedover transmitter 305 and receiver 310, as illustrated in the angled viewof semiconductor die 300 shown in FIG. 3C.

Sacrificial studs 335 and 340 are cylindrical shaped in this example,but may be hollow rings encircling transmitter 305 and receiver 310, orother shapes as shown in FIG. 5. Sacrificial studs 335 and 340 can bemade of metal, plastic, photoresist, or other appropriate materials andfastened to semiconductor die 300 by an adhesive material, surface mounttechnology, or the like. The sacrificial studs can be fabricated usingstandard mold tooling, equipment, materials, and processes withoutresorting to special mold tooling or inserts. Also, the sacrificialstuds can be created in parallel for each semiconductor die on wafer 330such that the manufacturing process is not unduly slowed by the step ofcreating the sacrificial studs.

The semiconductor die 300 is separated from the larger wafer 330 by adiamond saw, a laser, or other process, and attached to a lead frame 350and wire bonded 355, as shown in the closeup in FIG. 3D. FIG. 3Eillustrates the larger array 360 of multiple semiconductor dies 300attached to the lead frame 350. In some manufacturing processes, thesacrificial studs 335 and 340 can be placed after semiconductor die 300is attached to the lead frame 350 and wire bonded 355. In someimplementations, stress buffers and coatings such as polyimide,polybenzoxazole, and silicone coatings can be applied.

FIG. 3F shows an x-ray view of the single semiconductor 300 after it hasbeen encapsulated in a molding compound 370 such as plastic or epoxy.The sacrificial studs 335 and 340 act as barriers for mold flow andcreate a local cavity without the molding compound 370. The sacrificialstuds 335 and 340 are removed next, such as by chemical etching formetallic studs or light exposure for photoresist studs. A solvent canremove any remaining adhesive as needed. The material of sacrificialstuds 335 and 340, molding compound 370, transmitter 305 and receiver310, and the removal materials are chosen to ensure that the sacrificialstuds 335 and 340 can be removed without damaging transmitter 305 andreceiver 310 and leaving the molding compound intact.

FIG. 3G shows an x-ray view of the semiconductor die 300 withsacrificial studs 335 and 340 removed, leaving behind cavities 375 and380, respectively, and exposing transmitter 305 and receiver 310. Thecavities 375 and 380 allow transmitter 305 and receiver 310 to transmitand receive signals while a barrier of the molding compound 370 betweentransmitter 305 and receiver 310 ensures channel isolation between thetwo. The cavities 375 and 380 can be left empty or filled with atransparent plastic or other material that allows signals to be emittedand received unimpaired. In some implementations, lenses or otheroptical components can be aligned with the cavities 375 and 380.

The individual packages can be separated from the lead frame 350 andcalibrated for use, such as for use in a proximity sensor. Because thetransmitter 305 and receiver 310 are fixed relative to each other,calibration can be performed less frequently and more simply than inother systems in which the transmitter 305 and receiver 310 are onseparate semiconductor die and can move relative to each other. Thesemiconductor die 300 as packaged is attached to a printed circuit board390 and integrated into a larger system, as shown in FIG. 3H. Forexample, the semiconductor die 300 is incorporated into a proximitysensor or a LIDAR system 100, shown in FIG. 1.

FIG. 4 illustrates an example sensor package 400 with a multi-chipmodule. In some implementations, the desired substrate characteristicsfor the transmitter and the desired substrate characteristics for thereceiver are incompatible, such that the transmitter and the receiverare placed on separate semiconductor die with different characteristics.The separate semiconductor die are included in a single semiconductordie structure. The transmitter die 405 and the receiver die 410 can bepackaged as a multi-chip module according to the process outlined inFIGS. 3A-H. Transmitter die 405 and receiver die 410 are fastened to alead frame 450 by an adhesive 495 and wire bonded 455 together and tothe lead frame 450.

The semiconductor die structure including the two dies 405 and 410 andthe wire bonds 455 are encapsulated in molding compound 470, althoughcavities 475 and 480 remain open and create isolated channels fortransmitter die 405 and receiver die 410. Although the relativepositions of transmitter die 405 and receiver die 410 will not be asprecise as the transmitter 305 and receiver 310 on a singlesemiconductor die 300, calibration of sensor package 400 can be doneeasily and once after manufacturing and performed rarely after thatinitial calibration.

FIG. 5 illustrates example shapes of sacrificial studs 500-560 used infabricating a sensor package molding. The sacrificial studs can besquare-shaped, as illustrated by stud 500 with pointed corners and stud510 with rounded corners. Studs 520 and 540 are circular-shaped withtapered sides, such that the top surface of the studs is larger than thebottom surface. Similarly, studs 530 and 550 are cylindrical, with flatsides and substantially equal-sized top and bottom surfaces. Studs 520and 540 and studs 530 and 550 are similarly shaped but made of differentmaterials, such as metal and photoresist, respectively. While theseexample studs are solid, the sacrificial studs 500-550 can also behollow rings, such as stud 560.

Modifications are possible in the described embodiments, and otherembodiments are possible, within the scope of the claims.

What is claimed is:
 1. A method, comprising: affixing a firstsacrificial stud to a transmitter on a semiconductor die structure and asecond sacrificial stud to a receiver on the semiconductor diestructure; affixing the semiconductor die structure to a lead frame;wire bonding pads on the semiconductor die structure to the lead frame;encapsulating the lead frame, the semiconductor die structure, and thewire bonds in a molding compound, wherein a top of the first sacrificialstud and a top of the second sacrificial stud remain exposed, andwherein the first and second sacrificial studs prevent the moldingcompound from encapsulating the transmitter and the receiver; andremoving the first and second sacrificial studs, such that thetransmitter is exposed in a first cavity and the receiver is exposed ina second cavity.
 2. The method of claim 1, wherein the semiconductor diestructure comprises a first semiconductor die and a second semiconductordie, the first semiconductor die comprises the transmitter, and thesecond semiconductor die comprises the receiver.
 3. The method of claim1, further comprising filling at least one of the first and secondcavities with a non-molding compound material.
 4. The method of claim 3,wherein the transmitter comprises a light source, the receiver comprisesa light detector, and the non-molding compound material comprises atransparent material.
 5. The method of claim 1, wherein the moldingcompound comprises a barrier between the first and second cavities. 6.The method of claim 1, wherein affixing the first sacrificial stud tothe transmitter and the second sacrificial stud to the receivercomprises affixing a first tapered sacrificial stud to the transmitterand a second tapered sacrificial stud to the receiver.
 7. The method ofclaim 1, wherein the first and second sacrificial studs comprise tubessuch that the transmitter and the receiver remain exposed in the firstand second cavities while the lead frame, the semiconductor diestructure, and the wire bonds are encapsulated in the molding compound.8. The method of claim 1, wherein the first and second sacrificial studscomprise a metal, removing the first and second sacrificial studscomprises etching the metal with an etching chemical, and the etchingchemical is chosen to etch the metal without damaging the transmitter,the receiver, and the molding compound.
 9. The method of claim 1,wherein the first and second sacrificial studs comprise a plastic orphotoresist, and removing the first and second sacrificial studscomprises removing the plastic or photoresist without damaging thetransmitter, the receiver, and the molding compound.
 10. The method ofclaim 1, wherein affixing the first and second sacrificial studscomprises gluing, with an adhesive, the first sacrificial stud to thetransmitter and the second sacrificial stud to the receiver, removingthe first and second sacrificial studs comprises using a solvent toremove the adhesive from the transmitter and the receiver, and thesolvent is chosen to remove the adhesive without damaging thetransmitter, the receiver, and the molding compound.
 11. The method ofclaim 1, wherein the first sacrificial stud covers the transmitter suchthat no part of the transmitter is exposed, and the second sacrificialstud covers the receiver such that no part of the receiver is exposed.12. A device, comprising: a semiconductor die structure comprising atransmitter and a receiver; a lead frame, wherein the semiconductor diestructure is affixed to the lead frame, and pads on the semiconductordie structure are bonded by wire bonds to the lead frame; and a moldingcompound encapsulating the lead frame, the semiconductor die structure,and the wire bonds, wherein a first cavity in the molding compoundexposes the transmitter, a second cavity in the molding compound exposesthe receiver, and the molding compound forms a barrier between thetransmitter and the receiver.
 13. The device of claim 12, wherein thedevice comprises a proximity sensor, and the proximity sensor iscalibrated once to determine a position of the transmitter relative to aposition of the receiver.
 14. The device of claim 12, wherein thesemiconductor die structure comprises a first semiconductor die and asecond semiconductor die, the first semiconductor die comprises thetransmitter, and the second semiconductor die comprises the receiver.15. The device of claim 14, wherein the first semiconductor diecomprises a first substrate, and the second semiconductor die comprisesa second substrate.
 16. The device of claim 12, wherein at least one ofthe first and second cavities is filled with a non-molding compoundmaterial.
 17. The device of claim 12, wherein the transmitter comprisesa light source, the receiver comprises a light detector, and at leastone of the first and second cavities are filled with a transparentmaterial.
 18. The device of claim 12, wherein the transmitter comprisesa light source, the receiver comprises a light detector, and one or moreoptical components are aligned with the first and second cavities.
 19. Amethod, comprising: affixing a semiconductor die structure to a leadframe, wherein the semiconductor die structure comprises a light sourceand a light detector in a particular configuration, wherein theparticular configuration comprises a known spatial relationship betweenthe light source and the light detector; wire bonding pads on thesemiconductor die structure to the lead frame; affixing a firstsacrificial stud to the light source and a second sacrificial stud tothe light detector; encapsulating the lead frame, the semiconductor diestructure, and the wire bonds in a molding compound, wherein the firstand second sacrificial studs prevent the molding compound from coveringthe light source and the light detector; and removing the first andsecond sacrificial studs, such that the light source is exposed in afirst cavity and the light detector is exposed in a second cavity,wherein the molding compound forms a barrier between the light sourceand the light detector.
 20. The method of claim 19, further comprisingfilling the first and second cavities with a transparent material. 21.The method of claim 19, further comprising aligning one or more opticalcomponents with the first and second cavities.
 22. The method of claim19, wherein the known spatial relationship between the light source andthe light detector simplifies a calibration process for the light sourceand the light detector.